Freescale Semiconductor deploys advanced technology for achieving next generation device quality and reliablity with KTA
TEMPE, AZ. - December 2, 2009 - Freescale and Kinesys Test Advantage announced today that they have implemented breakthrough technology that removes the historical "wall" between in process wafer manufacturing data and die electrical test data in order to target hybrid automotive quality requirements
Automotive device supplier Freescale Semiconductor located in Toulouse, France is driving quality and reliability levels to ever higher standards in its manufacturing operations by employing Streetwise, an innovative software technology from Arizona-based Kinesys Test Advantage. Streetwise is a unique software platform that provides advanced multi process flow data analysis capabilities for exposing semiconductor device performance marginalities, thereby dramatically improving overall device quality and reliability.
Zero defect programs have become a norm in the automotive industry where quality is critical to the safety and reliability of a company's products.
Freescale and Kinesys Test Advantage have combined their respective expertise and technology to extend statistical post processing analysis to include wafer sort electrical test screenings, final outgoing inspection and in-process wafer fab parameters. Automatic multi-flow and across flow analysis of these new data sources generated from as many as ten (10) wafer manufacturing process flows will allow achievement of unprecedented quality levels for next generation automotive applications.
Historically, there have been incredible amounts of wafer fab parametric data (average ratio 1/10; one electrical test for ten in process wafer fab measurements) that have been used solely to monitor the wafer manufacturing processes. This same wafer fab data is a rich source of information that has not been leveraged to its full potential. Typically, in-process wafer fab measurements are stored into a database for lot processing traceability and process control. Freescale and Kinesys Test Advantage have implemented unique smoothing algorithms in order to translate sampled data from in-process wafer fab measurements into in-process die measurements without adding extra controls in the wafer fab. This development allows die level screening and detection of potential marginal device performance through multi-flow analysis classification rules based on statistical post processing.
"Freescale is now post processing twenty-four (24) wafer lots in a matter of minutes with up to ten (10) flows of in-process and electrical test die data per wafer in a single pass using Streetwise (see chart), whereas historically if this same comprehensive analysis were performed, it could take up to two (2) weeks," stated Frederic Tilhac, Kinesys Test Advantage Technical Program Manager.
"By incorporating wafer fab data using Streetwise advanced multi-flow analysis and device classification strategies, we are confident in our ability to meet our customers' demands for the next generation automotive quality standards demanded by our hybrid application markets and improve our manufacturing processes," said Alain Deram, Technical Director of Power Technology at Freescale Semiconductor.
"Freescale's deployment of Streetwise for their leading edge product applications is a tribute to our advanced technology that enables our customers to achieve next generation quality levels demanded by future automotive applications." commented Fabrice Dechoux, CEO of Test Advantage. "Streetwise is a unique, production-proven platform that enhances any device manufacturer's competitive advantage."
About Freescale Toulouse: The Freescale Toulouse facility was built in 1967 and is not only a semiconductor manufacturing site but also includes R&D, Sales and Marketing targeting Analog / Mixed-mode Power ICs and RF chips for automotive and networking infrastructure.
About Kinesys Test Advantage: In 2008, Test Advantage Software joined forces with Kinesys and formed Kinesys Test Advantage (KTA). Kinesys Test Advantage is a leading supplier of software based quality improvement and single device tracking (SDT) tools. KTA software incorporates a complete, fully automated production solution when combined with direct equipment connection to both test and assembly process elements. KTA technology empowers users in all areas of single device tracking and integrated statistical post-test processing analysis of manufacturing data. The Tempe, Arizona based company maintains offices throughout the world.
More information about Kinesys Test Advantage is available at www.kinesystestadvantage.com.
Test Advantage TM, Kinesys Test AdvantageTM, StreetwiseTM, StreetwiseTM Production, StreetwiseTM Engineering are trademarks or registered trademarks of Test Advantage, Inc. in the United States and in other countries. Other product and or service names mentioned herein may be trademarks of the companies with which they are associated.
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Automotive device supplier Freescale Semiconductor located in Toulouse, France is driving quality and reliability levels to ever higher standards in its manufacturing operations by employing Streetwise, an innovative software technology from Arizona-based Kinesys Test Advantage. Streetwise is a unique software platform that provides advanced multi process flow data analysis capabilities for exposing semiconductor device performance marginalities, thereby dramatically improving overall device quality and reliability.
Zero defect programs have become a norm in the automotive industry where quality is critical to the safety and reliability of a company's products.
Freescale and Kinesys Test Advantage have combined their respective expertise and technology to extend statistical post processing analysis to include wafer sort electrical test screenings, final outgoing inspection and in-process wafer fab parameters. Automatic multi-flow and across flow analysis of these new data sources generated from as many as ten (10) wafer manufacturing process flows will allow achievement of unprecedented quality levels for next generation automotive applications.
Historically, there have been incredible amounts of wafer fab parametric data (average ratio 1/10; one electrical test for ten in process wafer fab measurements) that have been used solely to monitor the wafer manufacturing processes. This same wafer fab data is a rich source of information that has not been leveraged to its full potential. Typically, in-process wafer fab measurements are stored into a database for lot processing traceability and process control. Freescale and Kinesys Test Advantage have implemented unique smoothing algorithms in order to translate sampled data from in-process wafer fab measurements into in-process die measurements without adding extra controls in the wafer fab. This development allows die level screening and detection of potential marginal device performance through multi-flow analysis classification rules based on statistical post processing.
"Freescale is now post processing twenty-four (24) wafer lots in a matter of minutes with up to ten (10) flows of in-process and electrical test die data per wafer in a single pass using Streetwise (see chart), whereas historically if this same comprehensive analysis were performed, it could take up to two (2) weeks," stated Frederic Tilhac, Kinesys Test Advantage Technical Program Manager.
"By incorporating wafer fab data using Streetwise advanced multi-flow analysis and device classification strategies, we are confident in our ability to meet our customers' demands for the next generation automotive quality standards demanded by our hybrid application markets and improve our manufacturing processes," said Alain Deram, Technical Director of Power Technology at Freescale Semiconductor.
"Freescale's deployment of Streetwise for their leading edge product applications is a tribute to our advanced technology that enables our customers to achieve next generation quality levels demanded by future automotive applications." commented Fabrice Dechoux, CEO of Test Advantage. "Streetwise is a unique, production-proven platform that enhances any device manufacturer's competitive advantage."
About Freescale Toulouse: The Freescale Toulouse facility was built in 1967 and is not only a semiconductor manufacturing site but also includes R&D, Sales and Marketing targeting Analog / Mixed-mode Power ICs and RF chips for automotive and networking infrastructure.
About Kinesys Test Advantage: In 2008, Test Advantage Software joined forces with Kinesys and formed Kinesys Test Advantage (KTA). Kinesys Test Advantage is a leading supplier of software based quality improvement and single device tracking (SDT) tools. KTA software incorporates a complete, fully automated production solution when combined with direct equipment connection to both test and assembly process elements. KTA technology empowers users in all areas of single device tracking and integrated statistical post-test processing analysis of manufacturing data. The Tempe, Arizona based company maintains offices throughout the world.
More information about Kinesys Test Advantage is available at www.kinesystestadvantage.com.
Test Advantage TM, Kinesys Test AdvantageTM, StreetwiseTM, StreetwiseTM Production, StreetwiseTM Engineering are trademarks or registered trademarks of Test Advantage, Inc. in the United States and in other countries. Other product and or service names mentioned herein may be trademarks of the companies with which they are associated.
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Comments
KINESYS SOFTWARE AND TEST ADVANTAGE JOIN FORCES
New Entity Launches Powerful New Software Roadmap; Combines Strengths in Single
Device Tracking and Advanced Device Performance Variability Detection
TEMPE, AZ. ? December 2, 2009 - Test Advantage Software and Kinesys Software have combined their respective technology development roadmaps into a new entity, to be known as Kinesys Test Advantage. The joining of the two companies leverages the synergies of Kinesys? Single Device Traceability and Test Advantage?s Advanced Semiconductor Device Variability detection technologies into a fully integrated production solution, enabling existing joint customers and the broader marketplace to take advantage of this fully integrated solution for employing advanced feed forward Adaptive Test Strategies.
The two parties have committed to the semiconductor device manufacturing marketplace to provide fully integrated ?end to end? product solutions that are deployed throughout the backend semiconductor manufacturing operations, and targeted to improve production efficiencies, reduce DPPM levels, and enable single device traceability while facilitating open data standards.
?The combined installed base of Test Advantage and Kinesys Software among IDM, OSAT and Fab-less companies and the merger of our production ready technologies, offers the market the next generation quality standards today, while simultaneously establishing Kinesys Test Advantage as the market leader in this space,? stated Dave Huntley, CEO of Kinesys Software.
?Next generation quality and cost demands are driving new advanced manufacturing strategies. Whereas Adaptive Test has become the latest buzz, the industry must look beyond the test cell and employ new feed forward strategies in order to continue to improve quality while at the same time attacking cost of manufacturing. Single Device traceability forms the backbone to enable end to end manufacturing and facility to facility data transfers required by these advanced manufacturing methods. We pride ourselves on continuing to advance our technologies and providing non-intrusive, cost effective solutions to our marketplace,? commented Fabrice Dechoux, CEO of Test Advantage. ?Kinesys Test Advantage provides a single source for both the technology and support for our end to end integrated solution.?
About KINESYS Software, Inc.: Founded in 1992, KINESYS Software is a privately held company that is focused on the automation of semiconductor manufacturing ?back-end? processes. In particular, the company offers innovative software products and expert support services for data management and equipment integration aimed at inkless assembly and single device tracking.
About Test Advantage, Inc.: Founded in 1997, Test Advantage, Inc. operates three divisions offering diverse solutions to the semiconductor industry. Test Advantage Hardware provides remanufactured/refurbished ATE capacity. Test Advantage Capital offers lease and rental solutions for new and used ATE system or sub-system capacity. Test Advantage Software develops and deploys leading-edge, proprietary software to automate manufacturing quality and throughput improvements throughout the manufacturing test process. The Tempe, Arizona-based company maintains offices worldwide.
More information about Kinesys Test Advantage is available at www.kinesystestadvantage.com.
Test Advantage ?, Kinesys Test Advantage?, Streetwise?, Streetwise? Production, Streetwise? Engineering are trademarks or registered trademarks of Test Advantage, Inc. in the United States and in other countries. Other product and or service names mentioned herein may be trademarks of the companies with which they are associated.
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Device Tracking and Advanced Device Performance Variability Detection
TEMPE, AZ. ? December 2, 2009 - Test Advantage Software and Kinesys Software have combined their respective technology development roadmaps into a new entity, to be known as Kinesys Test Advantage. The joining of the two companies leverages the synergies of Kinesys? Single Device Traceability and Test Advantage?s Advanced Semiconductor Device Variability detection technologies into a fully integrated production solution, enabling existing joint customers and the broader marketplace to take advantage of this fully integrated solution for employing advanced feed forward Adaptive Test Strategies.
The two parties have committed to the semiconductor device manufacturing marketplace to provide fully integrated ?end to end? product solutions that are deployed throughout the backend semiconductor manufacturing operations, and targeted to improve production efficiencies, reduce DPPM levels, and enable single device traceability while facilitating open data standards.
?The combined installed base of Test Advantage and Kinesys Software among IDM, OSAT and Fab-less companies and the merger of our production ready technologies, offers the market the next generation quality standards today, while simultaneously establishing Kinesys Test Advantage as the market leader in this space,? stated Dave Huntley, CEO of Kinesys Software.
?Next generation quality and cost demands are driving new advanced manufacturing strategies. Whereas Adaptive Test has become the latest buzz, the industry must look beyond the test cell and employ new feed forward strategies in order to continue to improve quality while at the same time attacking cost of manufacturing. Single Device traceability forms the backbone to enable end to end manufacturing and facility to facility data transfers required by these advanced manufacturing methods. We pride ourselves on continuing to advance our technologies and providing non-intrusive, cost effective solutions to our marketplace,? commented Fabrice Dechoux, CEO of Test Advantage. ?Kinesys Test Advantage provides a single source for both the technology and support for our end to end integrated solution.?
About KINESYS Software, Inc.: Founded in 1992, KINESYS Software is a privately held company that is focused on the automation of semiconductor manufacturing ?back-end? processes. In particular, the company offers innovative software products and expert support services for data management and equipment integration aimed at inkless assembly and single device tracking.
About Test Advantage, Inc.: Founded in 1997, Test Advantage, Inc. operates three divisions offering diverse solutions to the semiconductor industry. Test Advantage Hardware provides remanufactured/refurbished ATE capacity. Test Advantage Capital offers lease and rental solutions for new and used ATE system or sub-system capacity. Test Advantage Software develops and deploys leading-edge, proprietary software to automate manufacturing quality and throughput improvements throughout the manufacturing test process. The Tempe, Arizona-based company maintains offices worldwide.
More information about Kinesys Test Advantage is available at www.kinesystestadvantage.com.
Test Advantage ?, Kinesys Test Advantage?, Streetwise?, Streetwise? Production, Streetwise? Engineering are trademarks or registered trademarks of Test Advantage, Inc. in the United States and in other countries. Other product and or service names mentioned herein may be trademarks of the companies with which they are associated.
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KGD Packaging and Test Workshop
Focus on the Future with KTA
Kinesys Test Advantage offers insight into trends and technology within the TAP Semiconductor Industry.
It is clear that new innovative manufacturing methodologies must be applied during the back-end wafer sort, final test, and assembly processes in order to enable reduced manufacturing costs while continuing to improve outgoing device quality. While wafer sort is focused on testing device yield to specification, advanced statistical post processing methodologies compliment this process with testing yield based on wafer fabrication and assembly process performance. Combine the strengths of these data sets along with end to end single device traceability throughout the backend manufacturing process and you have an adaptive test opportunity to improve device manufacturing costs and at the same time improve device quality. Device Traceability throughout the back-end process from wafer parametric test through final test now provides a backbone to facilitate correlations between the advanced statistical post processing data and all subsequent process steps in order to optimize equipment utilization and improve device quality. Without single device tracking, such correlation and process flow management rests on the historical analysis of wafer/lot based statistics and potentially complex dedicated algorithms which translate to both quality risks and unnecessary production cost overheads. When multi-flow device disposition analysis and single device tracking converge, advanced correlations between process flow steps enable real time correlated device disposition decisions based on substantiated analysis results at each process intercept.
Another important benefit offered by the single device tracking is the ability to pin-point the devices to be recalled in the case of a field failure (see “Intelligent not Total Recall” – KGD 2008).
Adaptive test strategies can be deployed in conjunction with single device tracking to simultaneously drive down manufacturing costs and enable correlated device disposition analysis results to improve quality of shipped parts. Such technology is all the more important in the area of TRUSTED IC’s and KTA believes that such a complete and integrated solution is the future and backbone of cyber security.
It is clear that new innovative manufacturing methodologies must be applied during the back-end wafer sort, final test, and assembly processes in order to enable reduced manufacturing costs while continuing to improve outgoing device quality. While wafer sort is focused on testing device yield to specification, advanced statistical post processing methodologies compliment this process with testing yield based on wafer fabrication and assembly process performance. Combine the strengths of these data sets along with end to end single device traceability throughout the backend manufacturing process and you have an adaptive test opportunity to improve device manufacturing costs and at the same time improve device quality. Device Traceability throughout the back-end process from wafer parametric test through final test now provides a backbone to facilitate correlations between the advanced statistical post processing data and all subsequent process steps in order to optimize equipment utilization and improve device quality. Without single device tracking, such correlation and process flow management rests on the historical analysis of wafer/lot based statistics and potentially complex dedicated algorithms which translate to both quality risks and unnecessary production cost overheads. When multi-flow device disposition analysis and single device tracking converge, advanced correlations between process flow steps enable real time correlated device disposition decisions based on substantiated analysis results at each process intercept.
Another important benefit offered by the single device tracking is the ability to pin-point the devices to be recalled in the case of a field failure (see “Intelligent not Total Recall” – KGD 2008).
Adaptive test strategies can be deployed in conjunction with single device tracking to simultaneously drive down manufacturing costs and enable correlated device disposition analysis results to improve quality of shipped parts. Such technology is all the more important in the area of TRUSTED IC’s and KTA believes that such a complete and integrated solution is the future and backbone of cyber security.
