DEVICE DNA™
• Profiling device physical location on the wafer
• Enabling Adaptive Test and Adaptive process feed forward
• Enabling intelligence recall device performance profile
PROCESS Geneology™
• Enabling DEVICE DNA traceability and correlation from wafer sort
• Enabling Adaptive process feed forward
• Intelligence recall if / when needed
EMPOWER YOUR PROCESS
Device Performance and Device Traceability
Throughout the entire assembly flow
Kinesys Test Advantage
We are a leading supplier of software based quality improvement tools that address the quality and cost of manufacturing for semiconductor devices. Our software incorporates a complete, fully automated production solution when combined with direct equipment connection to both test and assembly process elements. KTA technology empowers our market in all areas of SDT (Single Device Tracking) and an integrated Statistical Post Test processing analysis of the test data. Such complete data analysis and tracking across the TAP process flow enables the following benefits:
• Cost and quality production improvements through non-intrusive implementation of Feed Forward adaptive test strategies.
• Increased manufacturing output as a result of implementing next generation wafer scrap strategies
• Die to final packaged product traceability and intelligent recall capability
• Closed-loop controls for ramp to production and process improvements
• Open Standard based solutions that easily port across manufacturing facilities (OSAT to IDM) regardless of location